发明名称 RECIPE CREATION DEVICE FOR USE IN SEMICONDUCTOR MEASUREMENT DEVICE OR SEMICONDUCTOR INSPECTION DEVICE
摘要 The purpose of the present invention is to provide a recipe creation device, with the goal of using past recipe data in order to highly efficiently create recipes. As an embodiment with which to achieve this goal, there is provided a recipe creation device comprising an arithmetic processing device that, on the basis of design data for a semiconductor element, establishes measurement conditions or inspection conditions by a semiconductor measurement device or a semiconductor inspection device, wherein the arithmetic processing device is configured to be able to access a database in which the measurement conditions or inspection conditions, and the pattern information of the semiconductor element, are stored in associated form, and the measurement conditions or inspection conditions are selected through a search using pattern information of the semiconductor element.
申请公布号 WO2016117103(A1) 申请公布日期 2016.07.28
申请号 WO2015JP51756 申请日期 2015.01.23
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 FUJITA HIROMI;KAWAHARA TOSHIKAZU;OTA YOSHIHIRO;SUKEGAWA SHIGEKI
分类号 G01B15/00;H01L21/66 主分类号 G01B15/00
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