发明名称 APPARATUS FOR PARALLEL PROCESSING OF SLIDE SPECIMENS IN RECEPTACLES
摘要 A test instrument includes multiple receptacle bays for testing specimens contained in specimen receptacles. The test instrument processes different specimens in different specimen receptacles in the respective receptacle bays in parallel. Different tests may be conducted in the receptacle bays at the same time. Each receptacle bay couples to one or more common bulk reagent stores and to one or more small volume reagent stores. This arrangement may provide a dramatic increase in specimen processing efficiency by enabling different tests to be conducted in each receptacle bay at the same time.
申请公布号 US2016282373(A1) 申请公布日期 2016.09.29
申请号 US201615079011 申请日期 2016.03.23
申请人 SYFR, INC. 发明人 Iqbal Shazi S.;Mayo Michael;Parks Paul;Greis Alexander
分类号 G01N35/00;G01N35/10 主分类号 G01N35/00
代理机构 代理人
主权项 1. A specimen processing apparatus, comprising: a plurality of receptacle bays each capable of receiving a respective receptacle that includes a specimen slide; and a plurality of common reagent stores accessible by each of the receptacle bays to supply reagents to the receptacle bays in parallel.
地址 Danville CA US
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