发明名称 MEASUREMENT METHOD FOR GENERATING CELL COVERAGE MAP AND DEVICE FOR THE SAME
摘要 The present invention relates to a measurement control method for MDT and a terminal device for the same. An MDT measurement control method of the present invention comprises a step of receiving measured frequency information for cell reselection and measured frequencies for MDT (MDT frequencies); a step of measuring a quality of a serving cell; a step of performing a first quality measurement on a neighboring cell; a step of performing a second quality measurement on the neighboring cell; and a step of storing results of the first and second quality measurements, wherein the step of performing the first quality measurement includes performing an intra-frequency measurement for the MDT on the neighbor cell when the frequency of the serving cell is included in the MDT frequencies, and performing the intra-frequency measurement for the neighbor cell only in the event where the quality of the serving cell in a first threshold value or less when the frequency of the serving cell is not included in the MDT frequencies, and the step of performing a second quality measurement includes performing an intra-frequency measurement for the MDT on the neighbor cell when an inter-frequency in the measured frequency information for the cell reselection is the MDT measurement frequency, and performing an intra-frequency measurement on the neighbor cell only in a case where the quality of the serving cell is a second threshold value or less when the inter-frequency in the measured frequency information for the cell reselection is not the MDT measurement frequency. The present invention also relates to terminal device for the MDT measurement control method.
申请公布号 EP2533565(A4) 申请公布日期 2016.11.16
申请号 EP20110737320 申请日期 2011.01.31
申请人 LG ELECTRONICS INC. 发明人 JUNG, SUNG HOON;CHUN, SUNG DUCK;YI, SEUNG JUNE;LEE, YOUNG DAE;PARK, SUNG JUN
分类号 H04W24/10 主分类号 H04W24/10
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