发明名称 半導体装置
摘要 A semiconductor device of the present invention includes a gate electrode which includes a pair of first protrusions and a second protrusion provided between the pair of first protrusions; a gate insulating film covering the gate electrode; a semiconductor film which is in contact with the gate insulating film and overlaps with the pair of first protrusions and the second protrusion; and a pair of electrodes which is in contact with the semiconductor film and overlaps with the pair of first protrusions. The side edges of the semiconductor film are on the outer sides than the top surfaces of the pair of first protrusions in the direction of the channel width of the semiconductor film. The side edges of the pair of electrodes are on the outer sides than the top surfaces of the pair of first protrusions in the direction of the channel width of the semiconductor film.
申请公布号 JP5961404(B2) 申请公布日期 2016.08.02
申请号 JP20120042660 申请日期 2012.02.29
申请人 株式会社半導体エネルギー研究所 发明人 遠藤 佑太
分类号 H01L29/786 主分类号 H01L29/786
代理机构 代理人
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