发明名称 WIRING SUBSTRATE AND SEMICONDUCTOR DEVICE
摘要 A wiring substrate includes a first reinforcement pattern stacked on a lower surface of a first insulation layer at a peripheral region located at an outer side of a wiring formation region. A first reinforcement via extends through a second insulation layer in the thickness-wise direction and contacts the first reinforcement pattern. A second reinforcement pattern is stacked on a lower surface of the second insulation layer and connected to the first reinforcement pattern by the first reinforcement via. The first reinforcement via includes a top that partially extends into the first insulation layer.
申请公布号 US2016379938(A1) 申请公布日期 2016.12.29
申请号 US201615183273 申请日期 2016.06.15
申请人 SHINKO ELECTRIC INDUSTRIES CO., LTD. 发明人 KODANI KOTARO
分类号 H01L23/00;H01L23/498 主分类号 H01L23/00
代理机构 代理人
主权项 1. A wiring substrate comprising: a first insulation layer; a first wiring layer stacked on a lower surface of the first insulation layer; a first reinforcement pattern stacked on the lower surface of the first insulation layer at a peripheral region located at an outer side of a wiring formation region where the first wiring layer is formed; a second insulation layer stacked on the lower surface of the first insulation layer to cover the first wiring layer; a first reinforcement via that extends through the second insulation layer in a thickness-wise direction and contacts the first reinforcement pattern; and a second reinforcement pattern stacked on a lower surface of the second insulation layer and connected to the first reinforcement pattern by the first reinforcement via, wherein the first reinforcement via includes a top that partially extends into the first insulation layer.
地址 NAGANO-KEN JP
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