发明名称 |
WIRING SUBSTRATE AND SEMICONDUCTOR DEVICE |
摘要 |
A wiring substrate includes a first reinforcement pattern stacked on a lower surface of a first insulation layer at a peripheral region located at an outer side of a wiring formation region. A first reinforcement via extends through a second insulation layer in the thickness-wise direction and contacts the first reinforcement pattern. A second reinforcement pattern is stacked on a lower surface of the second insulation layer and connected to the first reinforcement pattern by the first reinforcement via. The first reinforcement via includes a top that partially extends into the first insulation layer. |
申请公布号 |
US2016379938(A1) |
申请公布日期 |
2016.12.29 |
申请号 |
US201615183273 |
申请日期 |
2016.06.15 |
申请人 |
SHINKO ELECTRIC INDUSTRIES CO., LTD. |
发明人 |
KODANI KOTARO |
分类号 |
H01L23/00;H01L23/498 |
主分类号 |
H01L23/00 |
代理机构 |
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代理人 |
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主权项 |
1. A wiring substrate comprising:
a first insulation layer; a first wiring layer stacked on a lower surface of the first insulation layer; a first reinforcement pattern stacked on the lower surface of the first insulation layer at a peripheral region located at an outer side of a wiring formation region where the first wiring layer is formed; a second insulation layer stacked on the lower surface of the first insulation layer to cover the first wiring layer; a first reinforcement via that extends through the second insulation layer in a thickness-wise direction and contacts the first reinforcement pattern; and a second reinforcement pattern stacked on a lower surface of the second insulation layer and connected to the first reinforcement pattern by the first reinforcement via, wherein the first reinforcement via includes a top that partially extends into the first insulation layer. |
地址 |
NAGANO-KEN JP |