发明名称 TIME MEASURING DEVICE AND SEMICONDUCTOR DEVICE TESTER
摘要 PROBLEM TO BE SOLVED: To provide a time measuring device capable of precisely measuring the time between the edges of signals. SOLUTION: This time measuring device 100 is provided with a first selection section 116 selecting a received signal or its inverted signal as a first signal, a first driver 120 outputting the first signal, a second selection section 118 selecting the signal or the inverted signal as a second signal, a second driver 122 outputting the second signal, and a time measuring section 130 measuring the time between the edges of signals based on the edges of the wave-forms of the first signal and the second signal.
申请公布号 JP2001324551(A) 申请公布日期 2001.11.22
申请号 JP20000144058 申请日期 2000.05.16
申请人 ADVANTEST CORP 发明人 HAYASHI YOSHIO
分类号 G04F10/04;G01R31/28;G01R31/319;(IPC1-7):G01R31/319 主分类号 G04F10/04
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