发明名称 Structure to improve MOS transistor on-breakdown voltage and method of making the same
摘要 A novel MOS transistor structure and methods of making the same are provided. The structure includes a MOS transistor formed on a semiconductor substrate of a first conductivity type with a plug region of first conductivity type formed in the drain extension region of second conductivity type (in the case of a high voltage MOS transistor) or in the lightly doped drain (LDD) region of second conductivity type (in the case of a low voltage MOS transistor). Such structure leads to higher on-breakdown voltage. The inventive principle applies to MOS transistors formed on bulky semiconductor substrate and MOS transistors formed in silicon-on-insulator configuration.
申请公布号 US2008217693(A1) 申请公布日期 2008.09.11
申请号 US20070714569 申请日期 2007.03.06
申请人 WANG SHEN-PING;HUANG TSUNG-YI;WANG WEN-LIANG 发明人 WANG SHEN-PING;HUANG TSUNG-YI;WANG WEN-LIANG
分类号 H01L29/78 主分类号 H01L29/78
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