发明名称 |
ETCHSTOP LAYERS AND CAPACITORS |
摘要 |
Capacitor structures for integrated circuit devices are provided. Capacitors include proximate dense or highly dense etchstop layers. The dense or highly dense etchstop layer is, for example, a high-k material. Capacitors are, for example, metal-insulator-metal (MIM) capacitors and are useful in DRAM (dynamic random access memory) and eDRAM (embedded dynamic random access memory) structures. |
申请公布号 |
US2016233217(A1) |
申请公布日期 |
2016.08.11 |
申请号 |
US201615132037 |
申请日期 |
2016.04.18 |
申请人 |
Intel Corporation |
发明人 |
Brain Ruth A. |
分类号 |
H01L27/108;H01L21/768;H01L23/532;H01L49/02;H01L23/528 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device, comprising,
a first inter-layer dielectric (ILD) layer disposed above a silicon substrate; a first etch stop layer disposed on the first ILD layer; a second ILD layer disposed on the first etch stop layer; a second etch stop layer disposed on the second ILD layer; a third ILD layer disposed on the second etch stop layer; a third etch stop layer disposed on the third ILD layer; a metal-insulator-metal (MIM) capacitor formed along sidewalls and a bottom of a trench extending through the third etch stop layer, the third ILD layer, the second etch stop layer, the second ILD layer, and the first etch stop layer; a first plurality of metal lines in the second ILD layer and laterally adjacent the MIM capacitor; and a second plurality of metal lines in the third ILD layer and laterally adjacent the MIM capacitor. |
地址 |
Santa Clara CA US |