发明名称 |
POLISHING COMPOSITION CONTAINING CERIA PARTICLES AND METHOD OF USE |
摘要 |
The invention provides a chemical-mechanical polishing composition including wet-process ceria particles having a median particle size of about 25 nm to about 150 nm and a particle size distribution of about 300 nm or more, and an aqueous carrier. The invention also provides a method of polishing a substrate, especially a substrate comprising a silicon layer, with the polishing composition. |
申请公布号 |
US2016257855(A1) |
申请公布日期 |
2016.09.08 |
申请号 |
US201615056198 |
申请日期 |
2016.02.29 |
申请人 |
Cabot Microelectronics Corporation |
发明人 |
REISS Brian;Lam Viet;JIA Renhe |
分类号 |
C09G1/02;H01L21/306;B24B37/04 |
主分类号 |
C09G1/02 |
代理机构 |
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代理人 |
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主权项 |
1. A chemical-mechanical polishing composition comprising:
(a) wet-process ceria particles having a median particle size of about 25 nm to about 150 nm and a particle size distribution of about 300 nm or more, wherein the wet-process ceria particles have a surface that comprises tridentate hydroxyl groups and has a surface coverage of tridentate hydroxyl groups that is about 2.0×10−5 moles/m2 or more, and (b) an aqueous carrier. |
地址 |
Aurora IL US |