发明名称 POLISHING COMPOSITION CONTAINING CERIA PARTICLES AND METHOD OF USE
摘要 The invention provides a chemical-mechanical polishing composition including wet-process ceria particles having a median particle size of about 25 nm to about 150 nm and a particle size distribution of about 300 nm or more, and an aqueous carrier. The invention also provides a method of polishing a substrate, especially a substrate comprising a silicon layer, with the polishing composition.
申请公布号 US2016257855(A1) 申请公布日期 2016.09.08
申请号 US201615056198 申请日期 2016.02.29
申请人 Cabot Microelectronics Corporation 发明人 REISS Brian;Lam Viet;JIA Renhe
分类号 C09G1/02;H01L21/306;B24B37/04 主分类号 C09G1/02
代理机构 代理人
主权项 1. A chemical-mechanical polishing composition comprising: (a) wet-process ceria particles having a median particle size of about 25 nm to about 150 nm and a particle size distribution of about 300 nm or more, wherein the wet-process ceria particles have a surface that comprises tridentate hydroxyl groups and has a surface coverage of tridentate hydroxyl groups that is about 2.0×10−5 moles/m2 or more, and (b) an aqueous carrier.
地址 Aurora IL US