发明名称 Encoder, position measurement system and lithographic apparatus.
摘要 An encoder comprises an optical component and an enclosing device having a first surface portion and a second surface portion. The first surface portion is arranged to receive from an ambient environment a first radiation beam. The second surface portion is arranged to receive from the ambient environment a second radiation beam. The optical component is arranged to 5 combine the first radiation beam and the second radiation beam. The enclosing device is arranged to propagate the first radiation beam along a first path. The first path is between the first surface portion and the optical component. The enclosing device is arranged to propagate the second radiation beam along a second path. The second path is between the second surface portion and the optical component. The enclosing device is arranged to enclose a space, so as to 10 isolate the first path and the second path from the ambient environment.
申请公布号 NL2015639(A) 申请公布日期 2016.09.20
申请号 NL20152015639 申请日期 2015.10.21
申请人 ASML NETHERLANDS B.V. 发明人 WOUTER PRIL;MR. JAN PETER BAARTMAN;SUZANNE COSIJNS;EELCO KOOIKER;BRYAN TONG-MINH
分类号 H01L21/68 主分类号 H01L21/68
代理机构 代理人
主权项
地址