发明名称 PLANARIZATION OF METAL LAYER OVER PHOTORESIST
摘要 The invention provides a method for planarizing a metal layer, and a method for manufacturing a micromirror element. The method for planarizing the metal layer, without limitation, may include the steps of forming a metal layer (710) over a photoresist layer (510), and then planarizing the metal layer using a chemical mechanical polishing process.
申请公布号 WO2007035761(A3) 申请公布日期 2009.04.23
申请号 WO2006US36531 申请日期 2006.09.20
申请人 TEXAS INSTRUMENTS INCORPORATED;DICARLO, ANTHONY;CHEN, JINGQIU;HE, YANGHUA;BAKER, JAMES, C.;ROTHENBURY, DAVID, A. 发明人 DICARLO, ANTHONY;CHEN, JINGQIU;HE, YANGHUA;BAKER, JAMES, C.;ROTHENBURY, DAVID, A.
分类号 H01L21/302;B44C1/22;G03F1/00 主分类号 H01L21/302
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