Functional built-in self test for a chip

摘要

According to one embodiment, a self-test system integrated on a chip is provided, the chip including a functional logic module for performing a selected application. The self-test system includes a primary interface a primary interface to the functional logic module, the primary interface configured to interface with a primary device, an input interface protocol generator for generating a pattern to be inserted into the primary interface and a secondary interface to the functional logic module, the secondary interface configured to interface with a secondary device. The system also includes an emulator engine coupled to the secondary interface, the emulator engine for testing a function of the functional logic module based on the inserted patterns, the function being configured to communicate with a secondary device coupled to the secondary interface, wherein the emulator engine tests the function when no secondary device is coupled to the chip.

主权项

1. A self-test system integrated on a chip, the chip comprising a functional logic module for performing a selected application, the self-test system comprising:
a primary interface to the functional logic module, the primary interface configured to selectively interface with a primary device; an input interface protocol generator for generating one or more patterns to be inserted into the primary interface; a secondary interface to the functional logic module, the secondary interface configured to selectively interface with a secondary device; an emulator engine selectively coupled to the secondary interface, wherein the emulator engine is configured to test a function of the functional logic module based on the one or more patterns, the function being configured to test the function of the functional logic module with a switched connection from the secondary device to isolate the primary device and the secondary device, the test function being configured to communicate with the secondary device, wherein the emulator engine tests the function when one or more of the primary device and the secondary device is not coupled to the chip; an emulator checker in the emulator engine configured to determine that an input received by the emulator engine from the secondary interface is correct; wherein
an input generated by the functional logic module is based on the one or more patterns, andthe emulator engine is further configured to generate an output to the functional logic module based on the input generated by the functional logic module and the testing of the function; and an output interface protocol payload checker coupled to the primary interface for determining that a response provided by the functional logic module and received from the primary interface is correct by comparing the response to an expected result, the response provided by the functional logic module based on the output generated by the emulator engine.