发明名称 DETERMINING RESISTANCE STATES OF MEMRISTORS IN A CROSSBAR ARRAY
摘要 In one example in accordance with the present disclosure a method of determining a resistance state of a memristor in a crossbar array is disclosed. In the method, a combined reference-sneak current is determined based on a reference voltage, a sense voltage, a non-access voltage, and a voltage applied to a target row line. Also in the method a combined read-sneak current is determined based on a read voltage, a sense voltage, a non-access voltage, and a voltage applied to a reference row line. A resistance state of a target memristor is determined based on the combined reference-sneak current and the combined read-sneak current.
申请公布号 WO2016137449(A1) 申请公布日期 2016.09.01
申请号 WO2015US17367 申请日期 2015.02.24
申请人 HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP 发明人 JEON, Yoocharn
分类号 G11C13/00 主分类号 G11C13/00
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