发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND FABRICATION PROCESS THEREOF
摘要 A semiconductor IC device includes a buried interconnection in interconnection layers over a semiconductor substrate, in which electrical connection of interconnections are provided over and under an interconnection layer of an embedded interconnection from among the interconnection layers such that a first connecting conductor portion within a connecting hole extending from an upper interconnection toward the interconnection layer of a predetermined buried interconnection and a second connecting conductor portion within the connecting hole extending from a lower interconnection toward the interconnection layer of the predetermined buried interconnection are electrically connected via a connecting conductor portion for relay in the connecting groove of the interconnection layer of a predetermined buried interconnection. The connecting conductor portion for relay is sized so that the length of the connecting conductor portion for relay in an extending direction of the predetermined buried interconnection is longer than that of the connecting hole.
申请公布号 US2008230916(A1) 申请公布日期 2008.09.25
申请号 US20080126386 申请日期 2008.05.23
申请人 SAITO TATSUYUKI;NOGUCHI JUNJI;YAMAGUCHI HIZURU;OWADA NOBUO 发明人 SAITO TATSUYUKI;NOGUCHI JUNJI;YAMAGUCHI HIZURU;OWADA NOBUO
分类号 H01L23/52;H01L21/768;H01L23/485;H01L23/522;H01L23/528;H01L23/532 主分类号 H01L23/52
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