| 摘要 |
The present disclosure relates to a method for calibrating a projector (110). The method includes projecting a test pattern (150) onto a scene (160) or an object within the scene and capturing the test pattern using a camera (120a,120b). Once the test pattern image has been captured by the camera, the method further includes estimating by a processing element (130) a perspective projection matrix, warping the estimated projection matrix based on a non-linear distortion function, and modifying the projector to project light based on the distortion function. The present disclosure also relates to a presentation or projection system including two types of projectors for projecting an output presentation having a second image overlaid on a first image. |
