发明名称 VISUAL INSPECTION METHOD, DEVICE THEREFOR, AND IMAGE PROCESSING EVALUATION SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide a technology capable of improving substantial sensitivity by suppressing false reports, while keeping the whole defect capturing rate high, in order to solve the problem wherein high-sensitivity inspection becomes impossible because many false reports are detected when the sensitivity is set high in visual inspection. SOLUTION: This method has a constitution wherein an image characteristic quantity is calculated based on an image of a detected defect, and a coordinate characteristic quantity is calculated based on a position coordinate of the detected defect, and false report determination is performed following a decision tree comprising threshold processing to either of the image characteristic quantity and the coordinate characteristic quantity. Resultantly, since discrimination between an actual defect and a false report can be performed accurately by performing the false report determination following the decision tree by utilizing the image characteristic quantity and the coordinate characteristic quantity, high-sensitivity inspection becomes possible, while suppressing false reports. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009002743(A) 申请公布日期 2009.01.08
申请号 JP20070162770 申请日期 2007.06.20
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 SHIBUYA HISAE;MAEDA SHUNJI
分类号 G01N21/956;G01B11/30;H01L21/66 主分类号 G01N21/956
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