发明名称 VARIABLE RESISTANCE NON-VOLATILE MEMORY CELLS AND METHODS OF FABRICATING SAME
摘要 Methods of fabricating integrated circuit memory cells and integrated circuit memory cells are disclosed. An integrated circuit memory cell can be fabricated by forming a cup-shaped electrode on sidewalls of an opening in an insulation layer and through the opening on an ohmic layer that is stacked on a conductive structure. An insulation filling member is formed that at least partially fills an interior of the electrode. The insulation filling member is formed within a range of temperatures that is sufficiently low to not substantially change resistance of the ohmic layer. A variable resistivity material is formed on the insulation filling member and is electrically connected to the electrode.
申请公布号 US2008315174(A1) 申请公布日期 2008.12.25
申请号 US20070775657 申请日期 2007.07.10
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KANG SHIN-JAE;OH GYUHWAN;PARK INSUN;LIM HYUNSEOK;LIM NAK-HYUN
分类号 H01L21/336;H01L47/00 主分类号 H01L21/336
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