发明名称 |
QUANTUM WELL MOSFET CHANNELS HAVING LATTICE MISMATCH WITH METAL SOURCE/DRAINS, AND CONFORMAL REGROWTH SOURCE/DRAINS |
摘要 |
Embodiments described include straining transistor quantum well (QW) channel regions with metal source/drains, and conformal regrowth source/drains to impart a uni-axial strain in a MOS channel region. Removed portions of a channel layer may be filled with a junction material having a lattice spacing different than that of the channel material to causes a uni-axial strain in the channel, in addition to a bi-axial strain caused in the channel layer by a top barrier layer and a bottom buffer layer of the quantum well. |
申请公布号 |
US2016372574(A1) |
申请公布日期 |
2016.12.22 |
申请号 |
US201615219193 |
申请日期 |
2016.07.25 |
申请人 |
INTEL CORPORATION |
发明人 |
Majhi Prashant;Hudait Mantu K.;Kavalieros Jack T.;Pillarisetty Ravi;Radosavljevic Marko;Dewey Gilbert;Rakshit Titash;Tsai Willman |
分类号 |
H01L29/66;H01L21/768;H01L29/80;H01L29/51;H01L29/778;H01L29/78;H01L29/15;H01L29/417 |
主分类号 |
H01L29/66 |
代理机构 |
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代理人 |
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主权项 |
1. A method comprising:
removing (1) a first portion of a top barrier layer and of a channel layer of a quantum well in a substrate to form a first junction region, and (2) a different second portion of the top barrier layer and a channel layer to form a second junction region in the substrate; and forming a thickness of a junction material in the first junction region and in the second junction region; wherein the junction material has a lattice spacing larger than a lattice spacing of a channel material of the channel layer in a third portion of the channel layer between the first and second junction regions. |
地址 |
Santa Clara CA US |