发明名称 SEMICONDUCTOR DEVICE AND A METHOD OF MANUFACTURING THE SAME
摘要 In connection with a semiconductor device including a capacitor element there is provided a technique capable of improving the reliability of the capacitor element. A capacitor element is formed in an element isolation region formed over a semiconductor substrate. The capacitor element includes a lower electrode and an upper electrode formed over the lower electrode through a capacitor insulating film. Basically, the lower electrode and the upper electrode are formed from polysilicon films and a cobalt silicide film formed over the surfaces of the polysilicon films. End portions of the cobalt silicide film formed over the upper electrode are spaced apart a distance from end portions of the upper electrode. Besides, end portions of the cobalt silicide film formed over the lower electrode are spaced apart a distance from boundaries between the upper electrode and the lower electrode.
申请公布号 US2016372537(A1) 申请公布日期 2016.12.22
申请号 US201615256285 申请日期 2016.09.02
申请人 Renesas Electronics Corporation 发明人 KAWASHIMA Yoshiyuki;TOBA Koichi;ISHII Yasushi;MATSUI Toshikazu;HASHIMOTO Takashi
分类号 H01L49/02;H01L27/115;H01L27/06 主分类号 H01L49/02
代理机构 代理人
主权项 1. (canceled)
地址 Tokyo JP