发明名称 METHOD FOR MANUFACTURING A HIGH-RESISTIVITY SEMICONDUCTOR-ON-INSULATOR SUBSTRATE
摘要 A method for manufacturing a high-resistivity semiconductor-on-insulator substrate comprising the steps of: a) forming a dielectric layer and a semiconductor layer over a high-resistivity substrate, such that the dielectric layer is arranged between the high-resistivity substrate and the semiconductor layer; b) forming a hard mask or resist over the semiconductor layer, wherein the hard mask or resist has at least one opening at a predetermined position; c) forming at least one doped region in the high-resistivity substrate by ion implantation of an impurity element through the at least one opening of the hard mask or resist, the semiconductor layer and the dielectric layer; d) removing the hard mask or resist; and e) forming a radiofrequency, RF, circuit in and/or on the semiconductor layer at least partially overlapping the at least one doped region in the high-resistivity substrate.
申请公布号 US2016372484(A1) 申请公布日期 2016.12.22
申请号 US201615176925 申请日期 2016.06.08
申请人 Soitec 发明人 Nguyen Bich-Yen;Allibert Frederic;Maleville Christophe
分类号 H01L27/12;H01L21/266;H01L21/84;H01L23/66 主分类号 H01L27/12
代理机构 代理人
主权项 1. A method for manufacturing a high-resistivity semiconductor-on-insulator substrate comprising the steps of: a) forming a dielectric layer and a semiconductor layer over a high-resistivity substrate, such that the dielectric layer is arranged between the high-resistivity substrate and the semiconductor layer; b) forming a hard mask or resist over the semiconductor layer, wherein the hard mask or resist has at least one opening at a predetermined position; c) forming at least one doped region in the high-resistivity substrate by ion implantation of an impurity element through the at least one opening of the hard mask or resist, the semiconductor layer and the dielectric layer; d) removing the hard mask or resist; and e) forming a radiofrequency circuit in and/or on the semiconductor layer at least partially overlapping the at least one doped region in the high-resistivity substrate.
地址 Bernin FR