发明名称 Method of fabricating gate
摘要 A method for fabricating a gate. A gate oxide layer is formed on a substrate. A first doped polysilicon layer is formed on the gate oxide layer. A second doped polysilicon layer on the first doped polysilicon layer. A third doped polysilicon layer over the second polysilicon layer. The second doped polysilicon layer has a grain size larger than a grain size of both the first doped polysilicon layer and the third dope polysilicon layer.
申请公布号 US6150251(A) 申请公布日期 2000.11.21
申请号 US19990235660 申请日期 1999.01.22
申请人 UNITED MICROELECTRONICS CORP 发明人 YEW, TRI-RUNG;LUR, WATER
分类号 H01L21/28;H01L29/49;(IPC1-7):H01L21/476 主分类号 H01L21/28
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