发明名称 SEMICONDUCTOR DEVICES AND METHODS OF FABRICATING THE SAME
摘要 PURPOSE: A semiconductor device and a manufacturing method thereof are provided to remove a part of a spacer and a mask oxide layer without damaging a silicide layer. CONSTITUTION: A dummy gate pattern is formed on a substrate(100) including an NMOS area(10) and a PMOS area(20). A spacer structure is formed on a sidewall of the gate pattern. A recess region is formed on the exposed substrate of the PMOS area exposed by the spacer structure and the gate pattern. A compression stress pattern(170) is formed in the recess area. A mask oxide layer is formed on the sidewall of the spacer structure.
申请公布号 KR20120038280(A) 申请公布日期 2012.04.23
申请号 KR20100099956 申请日期 2010.10.13
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, SANG JINE;JUNG, YOUNG SUK;YOON, BO UN;HAN, JEONG NAM;CHO, BYUNG KWON
分类号 H01L21/8238 主分类号 H01L21/8238
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