发明名称 Method of fabricating semiconductor device
摘要 Methods of fabricating a semiconductor device include forming a deposited film on a semiconductor substrate in a process chamber by repeatedly forming unit layers on the semiconductor substrate. The unit layer is formed by forming a preliminary unit layer on the semiconductor substrate by supplying a process material including a precursor material and film-control material into the process chamber, purging the process chamber, forming a unit layer from the preliminary unit layer, and again purging the process chamber. The precursor material includes a central atom and a ligand bonded to the central atom, and the film-control material includes a hydride of the ligand.
申请公布号 US9349583(B2) 申请公布日期 2016.05.24
申请号 US201313775595 申请日期 2013.02.25
申请人 Samsung Electronis Co., Ltd. 发明人 Park Min-Young;Kim Youn-Soo;Kang Sang-Yeol;Yoo Cha-Young;Lim Jae-Soon;Choi Jae-Hyoung
分类号 H01L21/02;C23C16/04;C23C16/40;C23C16/455;H01L21/28;H01L49/02 主分类号 H01L21/02
代理机构 Myers Bigel Sibley & Sajovec, P.A. 代理人 Myers Bigel Sibley & Sajovec, P.A.
主权项 1. A method of fabricating a semiconductor device, comprising: forming a deposited film on a semiconductor substrate in a process chamber by repeatedly forming a unit layer on the semiconductor substrate; wherein forming the unit layer comprises: forming a preliminary unit layer on the semiconductor substrate by supplying a process material including a precursor material and a film-control material into the process chamber, wherein the precursor material includes a central atom and a ligand bonded to the central atom, and the film-control material comprises a hydride of the ligand of the precursor material;firstly purging the process chamber in which the semiconductor substrate having the preliminary unit layer is located;forming the unit layer from the preliminary unit layer in the firstly purged process chamber; andsecondly purging the process chamber in which the semiconductor substrate having the unit layer is located.
地址 KR