发明名称 |
Method of fabricating semiconductor device |
摘要 |
Methods of fabricating a semiconductor device include forming a deposited film on a semiconductor substrate in a process chamber by repeatedly forming unit layers on the semiconductor substrate. The unit layer is formed by forming a preliminary unit layer on the semiconductor substrate by supplying a process material including a precursor material and film-control material into the process chamber, purging the process chamber, forming a unit layer from the preliminary unit layer, and again purging the process chamber. The precursor material includes a central atom and a ligand bonded to the central atom, and the film-control material includes a hydride of the ligand. |
申请公布号 |
US9349583(B2) |
申请公布日期 |
2016.05.24 |
申请号 |
US201313775595 |
申请日期 |
2013.02.25 |
申请人 |
Samsung Electronis Co., Ltd. |
发明人 |
Park Min-Young;Kim Youn-Soo;Kang Sang-Yeol;Yoo Cha-Young;Lim Jae-Soon;Choi Jae-Hyoung |
分类号 |
H01L21/02;C23C16/04;C23C16/40;C23C16/455;H01L21/28;H01L49/02 |
主分类号 |
H01L21/02 |
代理机构 |
Myers Bigel Sibley & Sajovec, P.A. |
代理人 |
Myers Bigel Sibley & Sajovec, P.A. |
主权项 |
1. A method of fabricating a semiconductor device, comprising:
forming a deposited film on a semiconductor substrate in a process chamber by repeatedly forming a unit layer on the semiconductor substrate; wherein forming the unit layer comprises:
forming a preliminary unit layer on the semiconductor substrate by supplying a process material including a precursor material and a film-control material into the process chamber, wherein the precursor material includes a central atom and a ligand bonded to the central atom, and the film-control material comprises a hydride of the ligand of the precursor material;firstly purging the process chamber in which the semiconductor substrate having the preliminary unit layer is located;forming the unit layer from the preliminary unit layer in the firstly purged process chamber; andsecondly purging the process chamber in which the semiconductor substrate having the unit layer is located. |
地址 |
KR |