发明名称 METHOD OF MANUFACTURING THIN-FILM TRANSISTOR
摘要 According to one embodiment, a method of manufacturing a thin-film transistor includes forming a semiconductor layer on a gate electrode with an insulating layer 12 being interposed, forming interconnect formation layers on the semiconductor layer, forming a plurality of interconnects and electrodes by patterning the interconnect formation layers through etching, patterning the semiconductor layer in an island shape through etching after forming the electrodes, exposing a channel region of the semiconductor layer by etching a part of the electrodes on the semiconductor layer, and forming a protective layer so as to overlap the interconnects, the electrodes and the semiconductor layer having the island shape.
申请公布号 US2016211177(A1) 申请公布日期 2016.07.21
申请号 US201614996323 申请日期 2016.01.15
申请人 Japan Display Inc. 发明人 SUZUMURA lsao;ISHIDA Arichika;MIYAKE Hidekazu;MIYAKE Hiroto;YAMAGUCHI Yohei
分类号 H01L21/768;H01L29/66;H01L29/417;H01L21/02 主分类号 H01L21/768
代理机构 代理人
主权项 1. A method of manufacturing a thin-film transistor, the method comprising: forming a semiconductor layer above a gate electrode with an insulating layer being interposed; forming an interconnect formation layer on the semiconductor layer; forming a plurality of interconnects and electrodes by patterning the interconnect formation layer through etching; patterning the semiconductor layer in an island shape through etching after forming the electrodes; exposing a channel region of the semiconductor layer by etching a part of the electrodes on the semiconductor layer; and forming a protective layer so as to overlap the interconnects, the electrodes and the semiconductor layer having the island shape.
地址 Minato-ku JP