发明名称 |
MULTI-BEAM CURRENT QUANTITY MEASURING METHOD, MULTI-CHARGED PARTICLE DRAWING CONTROL DEVICE, AND MULTI-CHARGED PARTICLE BEAM DRAWING DEVICE |
摘要 |
A current quantity measuring method of multi-beams irradiates with a charged particle beam, amplifies an electric signal corresponding to multi-beams passed through a plurality of aperture holes of an aperture member having the plurality of aperture holes to form multi-beams by irradiation with the charged particle beam, receives the electric signal amplified in the minute current measurement unit and counting the number of electrons in the multi-beams, calculates a current quantity of the multi-beams passed through the plurality of aperture holes by using a product of the calculated number of electrons in the multi-beams and elementary charge, and corrects irradiation time of the charged particle beam of each of the plurality of aperture holes on the basis of the calculated current quantity. |
申请公布号 |
US2016211114(A1) |
申请公布日期 |
2016.07.21 |
申请号 |
US201615001717 |
申请日期 |
2016.01.20 |
申请人 |
NuFlare Technology, Inc. |
发明人 |
IWATA Hideyuki |
分类号 |
H01J37/24;G01R19/00;H01J37/244;H01J37/317 |
主分类号 |
H01J37/24 |
代理机构 |
|
代理人 |
|
主权项 |
1. A current quantity measuring method of multi-beams, the method comprising:
irradiating with a charged particle beam; amplifying, in a minute current measurement unit, an electric signal corresponding to multi-beams passed through a plurality of aperture holes of an aperture member having the plurality of aperture holes to form multi-beams by irradiation with the charged particle beam; receiving, in a digitizer, the electric signal amplified in the minute current measurement unit and counting the number of electrons in the multi-beams; calculating a current quantity of the multi-beams passed through the plurality of aperture holes by using a product of the calculated number of electrons in the multi-beams and elementary charge; and correcting, in a correction unit, irradiation time of the charged particle beam of each of the plurality of aperture holes on the basis of the calculated current quantity. |
地址 |
Yokohama-shi JP |