发明名称 Method for Manufacturing a Semiconductor Device by Hydrogen Treatment
摘要 A method of manufacturing a semiconductor device includes: forming a porous area at a surface of a semiconductor body; forming a semiconductor layer on the porous area by epitaxial growth; forming semiconductor regions including source, drain, body, emitter, base and/or collector regions in a front surface of the semiconductor layer, wherein the front surface of the semiconductor layer corresponds to a front side of the semiconductor device; introducing, after forming the semiconductor regions, hydrogen into the porous area by a thermal treatment, wherein the semiconductor layer with the semiconductor regions is separated from the semiconductor body along the porous area; and applying, after separation of the semiconductor layer, rear side processing to the semiconductor layer, wherein a rear side of the semiconductor layer corresponds to a rear side of the semiconductor device.
申请公布号 US2016372336(A1) 申请公布日期 2016.12.22
申请号 US201615253418 申请日期 2016.08.31
申请人 Infineon Technologies Austria AG 发明人 Schulze Hans-Joachim;Santos Rodriguez Francisco Javier;Mauder Anton;Baumgartl Johannes;Ahrens Carsten
分类号 H01L21/322;H01L21/265;H01L21/02 主分类号 H01L21/322
代理机构 代理人
主权项 1. A method of manufacturing a semiconductor device, the method comprising: forming a porous area at a surface of a semiconductor body; forming a semiconductor layer on the porous area by epitaxial growth; forming semiconductor regions including source, drain, body, emitter, base and/or collector regions in a front surface of the semiconductor layer, wherein the front surface of the semiconductor layer corresponds to a front side of the semiconductor device; introducing, after forming the semiconductor regions, hydrogen into the porous area by a thermal treatment, wherein the semiconductor layer with the semiconductor regions is separated from the semiconductor body along the porous area; and applying, after separation of the semiconductor layer, rear side processing to the semiconductor layer, wherein a rear side of the semiconductor layer corresponds to a rear side of the semiconductor device.
地址 Villach AT