发明名称 |
MULTI-LAYER ELECTRIC PROBE AND FABRICATING METHOD THEREOF |
摘要 |
A multi-layer electric probe, suitable for testing a to-be-tested device, includes a first strip layer and a second strip layer. The first strip layer has a first conductivity and a first mechanical strength. The second strip layer has a second conductivity and a second mechanical strength. The first strip layer and the second strip layer are solidly adhered together as a structural body so as to produce at least one of the desired capabilities of enduring current and mechanical strength. The multi-layer electric probe can further include at least a third strip layer having the capability of enduring current and the desired mechanical strength.
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申请公布号 |
US2008094084(A1) |
申请公布日期 |
2008.04.24 |
申请号 |
US20060616892 |
申请日期 |
2006.12.28 |
申请人 |
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE;SCH ELECTRONIC CO., LTD. |
发明人 |
HUANG MENG-CHI;CHOU MIN-CHIEH;CHANG FUH-YU;WU CHING-PING |
分类号 |
G01R31/02;H01R43/00 |
主分类号 |
G01R31/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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