发明名称 MULTI-LAYER ELECTRIC PROBE AND FABRICATING METHOD THEREOF
摘要 A multi-layer electric probe, suitable for testing a to-be-tested device, includes a first strip layer and a second strip layer. The first strip layer has a first conductivity and a first mechanical strength. The second strip layer has a second conductivity and a second mechanical strength. The first strip layer and the second strip layer are solidly adhered together as a structural body so as to produce at least one of the desired capabilities of enduring current and mechanical strength. The multi-layer electric probe can further include at least a third strip layer having the capability of enduring current and the desired mechanical strength.
申请公布号 US2008094084(A1) 申请公布日期 2008.04.24
申请号 US20060616892 申请日期 2006.12.28
申请人 INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE;SCH ELECTRONIC CO., LTD. 发明人 HUANG MENG-CHI;CHOU MIN-CHIEH;CHANG FUH-YU;WU CHING-PING
分类号 G01R31/02;H01R43/00 主分类号 G01R31/02
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