| 摘要 |
An endoscope system 1 comprises a head unit 4a, a connector unit 4c, and a CCU 5. The head unit 4a includes a test signal generation unit 12 which generates a first test pattern signal. The connector unit 4c includes a test signal generation unit 22 which generates a second test pattern signal which is the same pattern signal as a first test pattern, a first comparison circuit which outputs a result of comparison obtained by comparing the first test pattern signal and the second test pattern signal, and a test signal generation unit 24 which generates a third test pattern signal. The CCU 5 includes a test signal generation unit 32 which generates a fourth test pattern signal which is the same pattern signal as a third test pattern and a second comparison circuit which outputs a result of comparison obtained by comparing the third test pattern signal and the fourth test pattern signal. |
