发明名称 |
BUMP ELECTRODE MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To prevent generation of voids due to remaining of air bubbles in the vicinity of an interface of an underlying metal layer to manufacture a bump electrode having high junction reliability.SOLUTION: A bump electrode manufacturing method comprises: a plating process of forming a solder plating layer on a surface of an underlying metal layer on a substrate by electrolytic plating; and a reflow treatment process of melting the solder plating layer after the plating process to form a solder bump on the underlying metal layer. The plating process includes: a high-speed plating process of plating the surface of the underlying metal layer at high speed to form a lower plating layer out of the solder plating layer; and a low-speed plating process of plating a surface of the lower plating layer after the high-speed plating process at low speed to form the other upper plating layer of the solder plating layer. In the high-speed plating process, electrolytic plating is performed at a current density not less than two times higher than a current density during the low-speed plating process and not more than 25 ASD to form the lower plating layer with a thickness of 1 μm and over.SELECTED DRAWING: Figure 2 |
申请公布号 |
JP2016184695(A) |
申请公布日期 |
2016.10.20 |
申请号 |
JP20150064790 |
申请日期 |
2015.03.26 |
申请人 |
MITSUBISHI MATERIALS CORP |
发明人 |
MINEO KYOHEI;KATASE TAKUMA;ISHIKAWA MASAYUKI |
分类号 |
H01L21/60 |
主分类号 |
H01L21/60 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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