A method for manufacturing a ZrO thin film is provided to prevent carbon contamination and to restrain the generation of a silicon oxide layer by using Zr alone without an additional supply of oxygen source. A ZrO thin film is formed by performing an MOCVD(Metal Organic Chemical Vapor Deposition) using Zr compound as a precursor material. The predetermined Zr compound is represented by a predetermined chemical formula. The predetermined Zr compound is used for forming the ZrO thin film without an additional oxygen source. The predetermined Zr compound is kept in a predetermined temperature range of room temperature to 90 ‹C.
申请公布号
KR20060130976(A)
申请公布日期
2006.12.20
申请号
KR20050050745
申请日期
2005.06.14
申请人
KOREA RESEARCH INSTITUTE OF CHEMICAL TECHNOLOGY
发明人
KIM, YUN SOO;KIM, CHANG GYOUN;LEE, YOUNG KUK;CHUNG, TAEK MO;AN, KI SEOK;YANG, TAEK SEUNG;CHO, WON TAE