| 摘要 |
<P>PROBLEM TO BE SOLVED: To eliminate loss of processing power or loss of critical data due to single event upset (SEU) when a non-radiation hardened processor is impacted by high energy radiation or by a high energy particle. <P>SOLUTION: In an electronic computing device including at least one processing unit that implements a specific fault signal upon experiencing an associated fault, a control unit that generates a specific recovery signal upon receiving the fault signal from the at least one processing unit, and at least one input memory unit, the recovery signal initiates specific recovery processes in the at least one processing unit and the input memory buffers input data signals input to the at least one processing unit that experiences the fault during the recovery period. <P>COPYRIGHT: (C)2008,JPO&INPIT |
