| 摘要 |
Apparatus (1) comprising a transistor (2) and an integrated gate-source resistor (3), characterized in that the integrated gate-source resistor (3) is designed as a series circuit of a first integrated resistor (4) and a second integrated resistor (5), and in that a measuring pad is electrically connected via a connection located between the first integrated resistor (4) and the second integrated resistor (5), said measuring pad being arranged on a substrate of the apparatus (1), outside the series circuit of the first integrated resistor (4) and the second integrated resistor (5). |
