发明名称 AUTOMATIC ANALYZER
摘要 PROBLEM TO BE SOLVED: To provide an automatic analyzer capable of removing dispersion of accuracy caused by a level vial or an operator, and improving efficiency of a horizontal height control work upon installation of a reaction tank in the analyzer, without integrating newly a large-scale mechanism or component into the automatic analyzer.SOLUTION: While monitoring by a detection monitor 6 a metal detection establishment state of a first specimen sampling mechanism 1 and a second specimen sampling mechanism 2, adjusters 24, 25, 26 and 27 are adjusted so that each tip of two specimen probes 1a and 2a is brought into contact with the bottom surface of a reaction tank 5 simultaneously so as to establish detection.SELECTED DRAWING: Figure 1
申请公布号 JP2016183913(A) 申请公布日期 2016.10.20
申请号 JP20150064455 申请日期 2015.03.26
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 WADA KENTARO
分类号 G01N35/02 主分类号 G01N35/02
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