SEMICONDUCTOR DEVICE AND CONTROL METHOD THEREOF

摘要

According to an embodiment, a reconfigurable device 1 includes a configuration information storage memory 12, a state transition management unit 11, and a data path unit 13. When a failure is not detected in either of tiles T1 and T2 provided in the data path unit 13, the state transition management unit 11 selects the configuration information item so that a first processing circuit is configured using the tiles T1 and T2, while when a failure is detected in the tile T2, the state transition management unit 11 selects the configuration information item so that after a first intermediate processing circuit is configured using the tile T1 in which no failure is detected, a second intermediate processing circuit is configured again using the tile T1 in order to achieve the first processing circuit.

主权项

1. A semiconductor device comprising:
a configuration information storage memory that stores a plurality of configuration information items; a state transition management unit that selects any one of the plurality of configuration information items; and a data path unit that dynamically reconfigures a circuit according to the configuration information item selected by the state transition management unit, wherein when a failure is not detected in any one of a plurality of logic circuit groups provided in the data path unit, the state transition management unit selects the configuration information item so that a first processing circuit is configured using some or all of the plurality of logic circuit groups, and when a failure is detected in any one of the plurality of logic circuit groups, the state transition management unit selects the configuration information item so that a first intermediate processing circuit is configured using some or all of logical circuit groups in which no failure is detected from among the plurality of logic circuit groups, and then a second intermediate processing circuit is configured using some or all of the logical circuit groups in which no failure is detected from among the plurality of logic circuit groups, in order to achieve the first processing circuit.