发明名称 SAMPLE HOLDER, STAGE DEVICE, AND CHARGED PARTICLE BEAM APPARATUS INCLUDING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a sample holder that reduces a frictional force generated at a sliding surface of a spherical fulcrum and a spherical receiver, with which a stage is not deformed over time even when the stage is subjected to an oscillatable movement (sample position adjustment).SOLUTION: The sample holder includes: a holding part 111 for holding a sample; and a spherical fulcrum 127, disposed by being in close contact with a spherical receiver, capable of adjusting a sample position by sliding. A sliding surface of the spherical fulcrum 127 has a metal area 155 and an area 157 of a member whose friction is smaller than that of the metal.SELECTED DRAWING: Figure 8
申请公布号 JP2016173943(A) 申请公布日期 2016.09.29
申请号 JP20150053653 申请日期 2015.03.17
申请人 HITACHI LTD 发明人 WATABE SHIGEO
分类号 H01J37/20 主分类号 H01J37/20
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