| 摘要 |
Disclosed is an X-ray inspection apparatus which includes an X-ray imaging section (40) for imaging a target object (1) by means of X-rays, and a backup support mechanism section (60) including an up-and-down mechanism unit (66a, 66b) adapted to be disposed adjacent to or outward of at least one of two edges (1c, 1d) of the target object mutually opposed in a first direction (X direction) within a horizontal plane, and, when the target object is subjected to imaging by the X-ray imaging section, to be moved in an up-down direction (Z direction) perpendicular to the horizontal plane so as to support the target object. |
