发明名称 SEMICONDUCTOR SWITCH
摘要 PROBLEM TO BE SOLVED: To identify the point of a short-circuit failure or an open failure in a parallel multistage semiconductor switch, without depending on the operation state thereof.SOLUTION: In a semiconductor switch including semiconductor small switches in a parallel multistage connection, each having a control terminal, the control terminal connects all semiconductor small switches once, and thereafter, separately opens and closes each semiconductor small switch, to thereby identify a semiconductor small switch having a short-circuit failure or an open failure.SELECTED DRAWING: Figure 1
申请公布号 JP2016165032(A) 申请公布日期 2016.09.08
申请号 JP20150044306 申请日期 2015.03.06
申请人 NEC ENGINEERING LTD 发明人 FUJITA HITOSHI
分类号 H03K17/00 主分类号 H03K17/00
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