发明名称 Method and system for reduced power touch input detection on an electronic device using reduced scanning
摘要 Embodiments of the present invention can be configured to recognize and/or track certain types of touch input detected by a touch sensor, such as stylus input, during the performance of standard “full” touch scans in which each drive line of the touch sensor is generally scanned. Upon detection of these input types, “partial” touch scan operations can advantageously be performed which can dynamically reduce the number of lines scanned in a power-saving manner. These partial scans can be configured to intelligently initially scan the area where these input types were last detected so that there is minimal need to return to a previous “full” scan mode. If these specified touch inputs types are not detected during a “partial” scan mode, the touch sensor can be restored to a “full” scan mode until a subsequent detection of the touch input is determined, in which the touch sensor can be returned to a “partial” scan mode. Each time a partial scan is used, power is saved.
申请公布号 US9507470(B2) 申请公布日期 2016.11.29
申请号 US201314107845 申请日期 2013.12.16
申请人 NVIDIA Corporation 发明人 Jung David
分类号 G06F3/041;G06F3/044;G09G5/00 主分类号 G06F3/041
代理机构 代理人
主权项 1. A method of performing touch scan operations on a touch sensitive panel of a computing device, said method comprising: scanning a first set of scan lines associated with said touch sensitive panel using a first scan pattern; detecting a touch input within said first set of scan lines using said first scan pattern, wherein said touch input is recognized as a touch type that indicates a use case in which interaction with said touch sensitive panel is limited to said touch input; and responsive to a detection of said touch input, partially scanning said touch sensitive panel using a second scan pattern to detect subsequent touch inputs of said touch type, wherein said second scan pattern is different than said first scan pattern and wherein less power is consumed by said computing device using said second scan pattern versus said first scan pattern.
地址 Santa Clara CA US