发明名称 CMOS latch design with soft error immunity
摘要 A CMOS latch circuit comprises a data input node, an output node, and first and second inverters, each of which have an input coupled to the data input node, and an output coupled to the output node. Pairs of feedback NFETs and PFETs are each coupled in series between VCC and ground. Intermediate nodes between each of the NFET and PFET feedback pairs are coupled to the data input node. The gate of the first feedback NFET is coupled to the data input node, and the gate of the second NFET is coupled to the output node. Similarly, the gate of the first PFET is coupled to the output node, and the gate of the second PFET is coupled to the data input node. The CMOS latch circuit maintains a logic state at the output node regardless of a high-energy particle strike.
申请公布号 US6026011(A) 申请公布日期 2000.02.15
申请号 US19980159465 申请日期 1998.09.23
申请人 INTEL CORPORATION 发明人 ZHANG, KEVIN X.
分类号 G11C11/412;(IPC1-7):G11C11/00 主分类号 G11C11/412
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