发明名称 Etch of silicon nitride selective to silicon and silicon dioxide useful during the formation of a semiconductor device
摘要 A method for etching silicon nitride selective to silicon dioxide and silicon (polycrystalline silicon or monocrystalline silicon) comprises the use of oxygen along with an additional etchant of either CHF3 or CH2F2. Flow rates, power, and pressure settings are specified.
申请公布号 US2002168865(A1) 申请公布日期 2002.11.14
申请号 US20010854206 申请日期 2001.05.11
申请人 发明人 PECORA DAVID S.
分类号 H01L21/311;(IPC1-7):H01L21/302;H01L21/461 主分类号 H01L21/311
代理机构 代理人
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