发明名称 Method of manufacturing silicon carbide substrate
摘要 A method of manufacturing a silicon carbide substrate includes the steps of preparing an ingot of single crystal silicon carbide and obtaining a substrate by cutting the ingot. Then, in the step of obtaining a substrate, cutting proceeds in a direction α in which an angle β formed with respect to a <11-20> direction or a <1-100> direction of the ingot is 15°±5° in an orthogonal projection on a {0001} plane.
申请公布号 US9346187(B2) 申请公布日期 2016.05.24
申请号 US201213484724 申请日期 2012.05.31
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 Okita Kyoko
分类号 B26D3/28;B28D5/04;C30B29/36;C30B33/00;C30B33/06 主分类号 B26D3/28
代理机构 Drinker Biddle & Reath LLP 代理人 Drinker Biddle & Reath LLP
主权项 1. A method of manufacturing a silicon carbide substrate, comprising the steps of: preparing a crystal of single crystal silicon carbide having a cleavage direction that appears every 30 degrees in an orthogonal projection on a {0001} plane; and obtaining a substrate by cutting said crystal, wherein in said step of obtaining a substrate, the cutting of said crystal proceeds in a direction in which an angle formed with respect to a <11-20> direction or a <1-100> direction of said crystal is 15°±5° in the orthogonal projection on the {0001} plane, and in said step of obtaining a substrate, said crystal is cut such that a ratio of a diameter to a thickness of said substrate is not smaller than 100.
地址 Osaka-shi, Osaka JP