发明名称 |
Method of manufacturing silicon carbide substrate |
摘要 |
A method of manufacturing a silicon carbide substrate includes the steps of preparing an ingot of single crystal silicon carbide and obtaining a substrate by cutting the ingot. Then, in the step of obtaining a substrate, cutting proceeds in a direction α in which an angle β formed with respect to a <11-20> direction or a <1-100> direction of the ingot is 15°±5° in an orthogonal projection on a {0001} plane. |
申请公布号 |
US9346187(B2) |
申请公布日期 |
2016.05.24 |
申请号 |
US201213484724 |
申请日期 |
2012.05.31 |
申请人 |
SUMITOMO ELECTRIC INDUSTRIES, LTD. |
发明人 |
Okita Kyoko |
分类号 |
B26D3/28;B28D5/04;C30B29/36;C30B33/00;C30B33/06 |
主分类号 |
B26D3/28 |
代理机构 |
Drinker Biddle & Reath LLP |
代理人 |
Drinker Biddle & Reath LLP |
主权项 |
1. A method of manufacturing a silicon carbide substrate, comprising the steps of:
preparing a crystal of single crystal silicon carbide having a cleavage direction that appears every 30 degrees in an orthogonal projection on a {0001} plane; and obtaining a substrate by cutting said crystal, wherein in said step of obtaining a substrate, the cutting of said crystal proceeds in a direction in which an angle formed with respect to a <11-20> direction or a <1-100> direction of said crystal is 15°±5° in the orthogonal projection on the {0001} plane, and in said step of obtaining a substrate, said crystal is cut such that a ratio of a diameter to a thickness of said substrate is not smaller than 100. |
地址 |
Osaka-shi, Osaka JP |