发明名称 METHOD FOR MANUFACTURING MASK OF SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE: A method for manufacturing a mask of a semiconductor device is provided to improve a DoF margin of a cutting mask by changing a partition mask into a dogbon pattern shape. CONSTITUTION: A first sensitive film pattern of a dogbon shape is formed. Spacers are formed at the sidewall of the first sensitive film pattern. The spacers comprise a nitride film. A second sensitive film pattern is formed between the spacers. The second sensitive film pattern is a negative sensitive film. The spacers are eliminated. A first pattern is formed by etching the second sensitive film pattern by using a cutting mask as an etching mask. An isolation pattern(270) is formed by etching the first pattern by using a pad mask as the etching mask.</p>
申请公布号 KR20120081653(A) 申请公布日期 2012.07.20
申请号 KR20100124527 申请日期 2010.12.07
申请人 SK HYNIX INC. 发明人 PARK, JONG CHEON;CHO, BYUNG UG
分类号 H01L21/027;G03F1/76 主分类号 H01L21/027
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