发明名称 Robust FBEOL and UBM structure of C4 interconnects
摘要 A microcircuit article of manufacture comprises an electrical conductor electrically connected to both a first microcircuit element at a site comprising a first connector site having a first connector site axis and a second microcircuit element at a site comprising a second connector site having a second connector site axis. The first microcircuit element and the second microcircuit element are separated by and operatively associated with a layer comprising a first electrical insulator, whereas the conductor and the first microcircuit element are separated by and operatively associated with a layer comprising a second electrical insulator. At least one of the first electrical insulator layer and the second electrical insulator layer comprise a polymeric electrical insulator. In another embodiment, both electrical insulator layers comprise polymeric insulator layers. The microcircuit includes a UBM and solder connection to a FBEOL via opening. Sufficiently separating the first connector site axis and the second connector site axis so they are not concentric decouples the UBM and solder connection to the FBEOL via opening to substantially eliminate or minimize inter alia, electromigration and the white bump problem typical of lead free solders employed in C4 systems. A process comprises manufacturing this type of microcircuit article.
申请公布号 US8227918(B2) 申请公布日期 2012.07.24
申请号 US20090560769 申请日期 2009.09.16
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 LU MINHUA;PEFECTO ERIC D.;QUESTAD DAVID L.;RAY SUDIPTA K.
分类号 H01L23/48 主分类号 H01L23/48
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