发明名称 LIGHT WAVEFORM MEASURING DEVICE AND LIGHT WAVEFORM MEASURING METHOD
摘要 PROBLEM TO BE SOLVED: To eliminate the polarization dependence on the intensity correlated signals, without having to use a polarization diversity configuration. SOLUTION: The device comprises a sampling light output section 13 that has a light signal of a plurality of systems, having different wavelength as a light signal to be measured which is a target of waveform measurement and outputs sampling light pulses, for collectively sampling the light signals to be measured of the plural systems; a sampling result output section 44 that produces non-linear optical effects by the light signal to be measured of the plurality of the systems and the sampling light pulses from the sampling light output section to then output light of the collective sampling result of the light to be measured; and a polarization state control section 47 that can individually control the polarization states of the light signal to be measured, which is input into the sampling result output section, based on light power levels output from the sampling result output section 44 so as to perform waveform measurements, by using the light output from the sampling result output section 44. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009047713(A) 申请公布日期 2009.03.05
申请号 JP20080311348 申请日期 2008.12.05
申请人 FUJITSU LTD 发明人 FUTAMI FUMIO;WATANABE SHIGEKI
分类号 G01J11/00 主分类号 G01J11/00
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