| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an inspecting method capable of identifying a solid-state image sensor having a poor charge injection. Ž<P>SOLUTION: The inspecting method is used for the solid-state image sensor 5 comprising an output unit 55. The output unit 55 converts electron charges generated at each of a plurality of photoelectric conversion elements 51 into a voltage signal for output according to the amount of the electron charge. The method includes the steps of: performing imaging under a predetermined imaging condition by the solid-state image sensor 5; measuring, with a tester (measuring apparatus), part of the voltage signal (voltage signal corresponding to OB photoelectric conversion element 51) output by the imaging from the output unit 55; computing the average of the measured voltage signals; comparing the computed average with a reference value; determining that poor charge injection occurs if a difference between both values is over a threshold; and determining that poor charge injection does not occur if the difference between both values is equal to or less than the threshold. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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