发明名称 MEASURING DEVICE FOR RELECTION MEASUREMENTS OF TEST OBJECTS AND METHOD FOR MEASURING RADIATION REFLECTED BY TEST OBJECTS
摘要 A measuring device for reflection measurements of test objects includes a transmitter for emitting radiation, a first collimation element for aligning the emitted radiation, a first focusing element for focusing emitted radiation in relation to the test object, and a receiver for detecting radiation reflected by the test object. There is a second collimation element for aligning the reflected radiation, and a second focusing element for focusing the reflected radiation in relation to the receiver. At least two of the first and second collimation elements and first and second focusing elements are separate from each other. Thus, a simple and flexible design of the measuring device is achieved, which can be adapted to the test object.
申请公布号 US2016238375(A1) 申请公布日期 2016.08.18
申请号 US201615055391 申请日期 2016.02.26
申请人 INOEX GmbH 发明人 HOCHREIN Thomas
分类号 G01B11/06 主分类号 G01B11/06
代理机构 代理人
主权项 1. A measuring device for reflection measurements of test objects, comprising: a) a transmitter for emitting terahertz radiation; b) a first collimation element for aligning the emitted radiation; c) a first focusing element for focusing the emitted terahertz radiation relative to a test object; d) a receiver for detecting terahertz radiation reflected on a test object; e) a second collimation element for aligning the reflected terahertz radiation; f) a second focusing element for focusing the reflected terahertz radiation relative to the receiver; and g) at least two of the first and second collimation elements and the first and second focusing elements are separate from one another.
地址 Melle DE