| 摘要 |
PROBLEM TO BE SOLVED: To provide a fluorometric X-ray analyzer used for analyzing the composition of a sample, using an FP method and capable of sufficiently accurately analyzing various samples which contain many non-measuring elements that cannot be specified in their atomic numbers, over a wide adaptation range. SOLUTION: The fluorometric X-ray analyzer is equipped with a calculation means 10 constituted so that the theoretical intensities of secondary X rays 4, emitted from the respective elements in the sample 13, are calculated on the basis of the concentrations of the supposed elements and the concentrations are optimized and calculated so that the theoretical intensities match the intensities measured by a detection means 9 and the concentrations of the elements in the sample 13 are calculated. In the calculation means 10, the concentrations of a plurality of non-measuring elements are supposed, with respect to non-measuring elements, not being used in the measurement of fluorometric X rays 4 and the scattered lights of primary X rays, of which the number is at least equal to the number of the non-measuring elements supposed in concentration, are used in place of secondary X rays emitted from the non-measuring elements in the sample, while scattered lights that differ in wavelengths before scattered by the sample are contained in the scattered lights to be used of primary X rays. COPYRIGHT: (C)2007,JPO&INPIT |
