发明名称 METHOD FOR FORMING BISMUTH-LAYER-LIKE FERRODIELECTRIC FILM, SEMICONDUCTOR DEVICE HAVING THE BISMUTH-LAYER-LIKE FERRODIELECTRIC FILM, AND MANUFACTURING METHOD FOR THE SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To selectively form a bismuth-layer-like ferrodielectric film on a lower electrode by avoiding an insulating film. SOLUTION: A method for forming the bismuth-layer-like ferrodielectric film includes a step (a) of forming a polycrystalline conductive film 110 in an amorphous insulating film 181, formed on a board 100 so as to expose a part of the polycrystalline conductive film 110, and a step (b) of selectively forming the bismuth-layer-like ferrodielectric film 111 on the exposed portion of the polycrystalline conductive film 110. At the step (b), the formation of an oxide film, containing a constituent element of the bismuth-layer-like ferrodielectric film 111 on the amorphous insulating film 181, is prevented. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008211005(A) 申请公布日期 2008.09.11
申请号 JP20070046602 申请日期 2007.02.27
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 ISOGAI KAZUNORI
分类号 H01L21/8246;H01L21/316;H01L27/105 主分类号 H01L21/8246
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