发明名称 |
HIGH-STABILITY POLYURETHANE POLISHING PAD |
摘要 |
PROBLEM TO BE SOLVED: To provide a polishing pad suitable for planarizing at least one of semiconductor, optical and magnetic substrates.SOLUTION: A polishing pad comprises: a cast polyurethane polymeric matrix formed from an isocyanate-terminated molecule and a curative agent. The cast polyurethane polymeric matrix contains 4.2-7.5 weight percent fluid-filled microspheres in the isocyanate-terminated molecule. The fluid-filled-microspheres are polymeric and have an average diameter of 10-80 μm. The polishing pad has a conditioner sensitivity (CS) of 0-2.6.SELECTED DRAWING: None |
申请公布号 |
JP2016129223(A) |
申请公布日期 |
2016.07.14 |
申请号 |
JP20150246214 |
申请日期 |
2015.12.17 |
申请人 |
ROHM & HAAS ELECTRONIC MATERIALS CMP HOLDINGS INC;DOW GLOBAL TECHNOLOGIES LLC |
发明人 |
QIAN BAINIAN;GEORGE C JACOB;TSAI KUN-MING |
分类号 |
H01L21/304;B24B37/24 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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