| 摘要 |
PROBLEM TO BE SOLVED: To provide an X-ray inspection device that, even when there are a number of selectable inspection algorithms, enables a user to easily grasp the characteristics of the inspection algorithms and easily determine an inspection algorithm suitable for inspection.SOLUTION: An X-ray inspection device 1 comprises: an image processing part 43 that creates a projection image that is a two-dimensional sectional waveform image obtained by drawing peak values of gray levels in a direction orthogonal to a direction of conveyance of the gray image on a gray image resulting from carrying out a plurality of inspection algorithms in the direction of conveyance; and a display control part 47 that displays a plurality of projection images corresponding respectively to the plurality of inspection algorithms simultaneously on a display unit so that the projection images can be identified from each other and match with positions in the direction of conveyance.SELECTED DRAWING: Figure 2 |
